C-Mode Scanning Acoustic Microscopy – CSAM
C-mode Scanning Acoustic Microscopy (C-SAM) is a non-destructive testing technique [...]
Calibration
Calibration refers to the process of comparing the measurements of [...]
Circuit Simulation
Circuit Simulation involves using specialized software to model the behavior [...]
DPA – Destructive Physical Analysis
A process that examines an item through a destructive process [...]
DSP – (Digital Signal Processing)
DSP stands for Digital Signal Processing. It is a field [...]
Fabless
"Fabless" refers to a business model in the semiconductor industry [...]
Flash Testing
A Flash Test, also known as a Dielectric Withstand Test [...]
Flux
Flux: Flux is a substance used in soldering to clean [...]
Gold Sample
A component gold sample typically refers to a prototype or [...]
HiPot Testing
A Hipot test, short for high potential test or high [...]